Avaliação em Testes de Estresse Térmico em Componentes Eletrônicos

Autores

  • Priscila Custodio Matos Universidade de Taubaté - UNITAU
  • Valesca Alves Corrêa Universidade de Taubaté - UNITAU Faculdade de Tecnologia de Pindamonhangaba - FATEC
  • Luiz Eduardo Nicolini do Patrocínio Nunes Universidade de Taubaté - UNITAU

Resumo

Testes de estresse são destinados a avaliar o comportamento e desempenho de componentes eletrônicos quando submetidos a esforços térmicos, mecânicos, elétricos, pressão, químicos. Dentre os fatores que mais influenciam a confiabilidade e o desempenho de componentes eletrônicos se destaca o estresse térmico. A temperatura desencadeia uma série de mecanismos de falha que degradam o componente e que pode acarretar perda de desempenho ou ainda levar a falhas intermitentes ou catastróficas. Neste trabalho são apresentados os testes de estresse térmico, usualmente empregados pela indústria eletrônica para verificação da qualidade de componentes eletrônicos e a relação entre os mecanismos de falha e as condições de teste. São apresentadas algumas avaliações sobre os parâmetros que devem ser observados desde o planejamento até a conclusão do teste.

Biografia do Autor

Priscila Custodio Matos, Universidade de Taubaté - UNITAU

Priscila Custódio de Matos received Bachelor’s degree in Electrical Engineering and MBA in Project Management and Strategic Management of Science and Technology in Public Institutions from Fundação Getúlio Vargas (FGV), both institutions in São José dos Campos - SP. between 1996 and 2002, wworked at Integration and Testing Laboratory (LIT) of the Brazilian Institute for Space Research (INPE) as a electronic technician of Integration and Testing Team, performing activities related to the assembly, integration and electrical functional tests on satellites. After that she joined, as an electronic technician, during three years the Satellite Navigation Systems Team at the Institute of Aeronautical Technology (ITA). In 2005 she returned to INPE-LIT as test engineer of Qualification and Reliability of Electronic Components for space application, where she coordinates procurement, specifying, testing and qualification of electronic components for space application. She is also responsible for coordinate failure analysis of electronic components; functional and parametric tests on electrical/electronic components and testing printed circuit boards.

Valesca Alves Corrêa, Universidade de Taubaté - UNITAU Faculdade de Tecnologia de Pindamonhangaba - FATEC

Valesca Alves Corrêa graduated in technologist in data processing from Universidade de Taubaté (1986). In 1991 received the B. S. degree in electrical engineering and in 2000 master degree in mechanical engineering from Universidade de Taubaté. In 2007 received mechanical engineering PhD from the Universidade Estadual Paulista Júlio de Mesquita Filho. She is currently assistant professor at Universidade de Taubaté and at FATEC. Has experience in computer science and heat transfer, with emphasis on computer simulation on the following topics: symbolic computation, CFD, programming languages, simulation in production and operations research systems.

Luiz Eduardo Nicolini do Patrocínio Nunes, Universidade de Taubaté - UNITAU

Luiz Eduardo Nicolini do Patrocínio Nunes graduated in technologist in data processing from Universidade de Taubaté (1984). In 1991 received the B. S. degree in computer science and in 1999 master degree in mechanical engineering from Universidade de Taubaté. In 2007 received mechanical engineering PhD from the Universidade Estadual Paulista Júlio de Mesquita Filho (FEG-UNESP). Currently he is assistant professor at Universidade de Taubaté on the following topics: Images and Computer Graphic Processing, Algorithms and C Programming Language, Computer Aided Design (AutoCAD, Autodesk Inventor and Catia v5) and Finite Element.

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Publicado

2016-07-22

Edição

v. 9 n. 1 (2016): RETEC - Revista de Tecnologias

Seção

Artigos